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Indian Journal of Forensic Medicine and Pathology

Volume  14, Issue 2 (Special Issue), April-June 2021, Pages 158-162
 

Original Article

Study of a Two-Unit High-Performance Thin Layer Chromatography System with Partial Failure

Divesh Garg,1 Reena Garg,

1 Research Scholar, 2 Assistant Professor, J.C. Bose University of Science and Technology, Faridabad, Haryana 121006, India.

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DOI: http://dx.doi.org/10.21088/ijfmp.0974.3383.14221.20

Abstract

High-Performance Tin Layer Chromatography (HPTLC) is one of the revolu tionary techniques that has the advantage of full optimization, minimum samplepreparation, automation and hyphenation. Using HPTLC system is used frequently in
forensic science for analysis of new drugs, poison, fngerprints, etc. In this paper, we
study the major and minor faults of two units of HPTLC system by considering the
fact that for minor and major faults, system goes to the partial failure and complete
failure, respectively. On occurrence of a fault in a system, either the repairman carries
out the system to repair or if repairman is busy unit have to wait for repair. Systems
parameters are derived by utilizing regenerative point graphical technique. Experimental results are performed to analyze system availability, server visit, busy period
and proft. Graphical representations are shown for better understanding of the proposed technique.
 


Corresponding Author : Divesh Garg